标题: Control Charts for the Lognormal Mean
作者: Huang, Wei-Heng
Wang, Hsiuying
Yeh, Arthur B.
统计学研究所
Institute of Statistics
关键字: average run length;lognormal distribution;X-chart
公开日期: 六月-2016
摘要: Among a set of tools that form the core of statistical process control, statistical control charts are most commonly used for controlling, monitoring, and improving processes. The conventional control charts are based on the assumption that the distribution of the quality characteristic to be monitored follows the normal distribution. However, in real applications, many process distributions may follow a positively skewed distribution such as the lognormal distribution. In this study, we discuss the construction of several control charts for monitoring the mean of the lognormal distribution. A real example is used to demonstrate how these charts can be applied in practice. Copyright (c) 2015 John Wiley & Sons, Ltd.
URI: http://dx.doi.org/10.1002/qre.1841
http://hdl.handle.net/11536/133757
ISSN: 0748-8017
DOI: 10.1002/qre.1841
期刊: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Volume: 32
Issue: 4
起始页: 1407
结束页: 1416
显示于类别:Articles