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dc.contributor.authorWang, Yao-Chinen_US
dc.contributor.authorLin, Bor-Shyhen_US
dc.contributor.authorYang, Zu-Poen_US
dc.date.accessioned2017-04-21T06:55:17Z-
dc.date.available2017-04-21T06:55:17Z-
dc.date.issued2016-05-26en_US
dc.identifier.issn0013-5194en_US
dc.identifier.urihttp://dx.doi.org/10.1049/el.2016.0412en_US
dc.identifier.urihttp://hdl.handle.net/11536/133760-
dc.description.abstractA phototransistor with aluminium (Al)/porous silicon (Si)/epitaxial-Si structures was proposed and was fabricated and characterised with short wavelength enhanced operating. We proposed the short wavelength response of the Si-based thin film phototransistor; it can be enhanced by introducing thin porous Si (PS) layer as the base region of transistor. The porous process of device manufacture is suitable for applications in design of visible-light sensitive phototransistors. Experimental results showed that the short wavelength responses in the developed devices were enhanced as compared with the Si-based homojunction transistors, this comparably medium optical gain indicated that the developed Al/PSi/epitaxial-Si heterojunction thin film phototransistor got potential for practical Si-based optical-electron integrated-circuit and biophotonics applications.en_US
dc.language.isoen_USen_US
dc.titleShort wavelength enhanced phototransistor with n-doped porous silicon layeren_US
dc.identifier.doi10.1049/el.2016.0412en_US
dc.identifier.journalELECTRONICS LETTERSen_US
dc.citation.volume52en_US
dc.citation.issue11en_US
dc.citation.spage947en_US
dc.citation.epage948en_US
dc.contributor.department光電學院zh_TW
dc.contributor.departmentCollege of Photonicsen_US
dc.identifier.wosnumberWOS:000377433800032en_US
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