Full metadata record
DC FieldValueLanguage
dc.contributor.authorChin, Alberten_US
dc.contributor.authorShih, Cheng Weien_US
dc.contributor.authorLu, Chun Fuen_US
dc.contributor.authorSu, Wei Fangen_US
dc.date.accessioned2017-04-21T06:50:13Z-
dc.date.available2017-04-21T06:50:13Z-
dc.date.issued2016en_US
dc.identifier.isbn978-4-9908753-1-2en_US
dc.identifier.urihttp://hdl.handle.net/11536/134350-
dc.description.abstractVery high mobility of 149 +/- 189 cm(2)/Vs, large on-to-off current ratio (I-ON/I-OFF) of >7 orders of magnitude, fast turn-on sub-threshold swing of 110 mV/decade, and low power operation at 2 similar to 2.5 V were achieved in SnO2 TFT device at an ultra-thin SnO2 thickness of 4.5 nm. The device mobility of SnO2 TFT is higher than the best ZnO-based TFTs and CVD-grown multi-layers MoS2 MOSFETs. The reached mobility is already 0.7 times of universal mobility of SiO2/Si nMOSFET, operated typically at >= 1 MV/cm field. The very high mobility, simple low temperature process, and ultra-thin body SnO2 transistor should find its crucial role for high resolution display, future sub-10 nm nMOSFET and brain-mimicking 3D IC.en_US
dc.language.isoen_USen_US
dc.titleHigh Mobility SnO2 TFT for Display and Future ICen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2016 23RD INTERNATIONAL WORKSHOP ON ACTIVE-MATRIX FLATPANEL DISPLAYS AND DEVICES (AM-FPD)en_US
dc.citation.spage294en_US
dc.citation.epage297en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000389600900095en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper