標題: Using Ensemble Empirical Mode Decomposition to Improve the Static Fringe Analysis in Optical Testing
作者: Chen, Yu-Ta
Mang Ou-Yang
Wu, Shuen-De
Lin, Shiou-Gwo
Kuo, Yi-Ting
Lee, Cheng-Chung
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: static fringe analysis;optical testing;ensemble empirical mode decomposition
公開日期: 2012
摘要: Static fringe analysis is an important skill to reconstruct the surface profile of the tested optics. The mixed image is simulated by the tilt aberration, and several methods of the reducing mixing fringe are utilized to reconstruct the optical paths difference (OPD) profile of the mixed image. In this paper, we propose the ensemble empirical mode decomposition (EEMD) method to decompose the mixed image into several intrinsic mode functions (IMFs), and then removing one or more IMFs to reduce the influence of the mixing fringe in the mixed image. The procedure of reducing mixing fringe can reconstruct the OPD profile of the mixed image easily. In the simulation, using EEMD to reduce the influence of the mixing fringe, the root mean square (RMS) value of the OPD is 0.081 waves as the residue image subtracted from the OPD profiles of original image. In the experiment, the EEMD method reducing the noise of the mixing fringe has the advantage on the high frequency as spherical aberration.
URI: http://hdl.handle.net/11536/134386
ISBN: 978-1-4577-1771-0
ISSN: 1091-5281
期刊: 2012 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
起始頁: 249
結束頁: 253
Appears in Collections:Conferences Paper