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dc.contributor.authorChu, SCen_US
dc.contributor.authorChern, JLen_US
dc.date.accessioned2014-12-08T15:18:42Z-
dc.date.available2014-12-08T15:18:42Z-
dc.date.issued2005-08-01en_US
dc.identifier.issn1084-7529en_US
dc.identifier.urihttp://dx.doi.org/10.1364/JOSAA.22.001600en_US
dc.identifier.urihttp://hdl.handle.net/11536/13442-
dc.description.abstractA tunable asymmetrically-embedded-aperture interferometer configuration is proposed to enhance the measurement sensitivity of subwavelength variation. With this configuration, an aperture of reference was posited asymmetrically, relative to the test aperture, that exhibited subwavelength variation. By a shift in the relative position of the reference aperture, the detection sensitivity of measuring the subwavelength variation in the far field can be enhanced to a desired value at any specific detection width. We discuss the underlying mechanism of optimization and address the difference between the embedded-aperture interferometry and tunable asymmetrically-embedded-aperture interferometry with respect to tolerance. (C) 2005 Optical Society of America.en_US
dc.language.isoen_USen_US
dc.titleIdentifying the subwavelength-aperture-width variation in the far field with tunable asymmetrically-embedded-aperture interferometer configurationen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/JOSAA.22.001600en_US
dc.identifier.journalJOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISIONen_US
dc.citation.volume22en_US
dc.citation.issue8en_US
dc.citation.spage1600en_US
dc.citation.epage1606en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000230830100015-
dc.citation.woscount2-
Appears in Collections:Articles