完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chang, Bor-Wei | en_US |
dc.contributor.author | Hsu, Hsin-Chyh | en_US |
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.date.accessioned | 2017-04-21T06:49:43Z | - |
dc.date.available | 2017-04-21T06:49:43Z | - |
dc.date.issued | 2007 | en_US |
dc.identifier.isbn | 978-1-4244-0582-4 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/134458 | - |
dc.description.abstract | Synchronous Bias Transmission Line Pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line Pulse. It\'s a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It\'s important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in LabVIEW environment to create a smart and friendly test workbench. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Automation of synchronous bias transmission line pulsing system | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2007 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PAPERS | en_US |
dc.citation.spage | 232 | en_US |
dc.citation.epage | + | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000247000000058 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |