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dc.contributor.authorChang, Bor-Weien_US
dc.contributor.authorHsu, Hsin-Chyhen_US
dc.contributor.authorKer, Ming-Douen_US
dc.date.accessioned2017-04-21T06:49:43Z-
dc.date.available2017-04-21T06:49:43Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-0582-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/134458-
dc.description.abstractSynchronous Bias Transmission Line Pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line Pulse. It\'s a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It\'s important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in LabVIEW environment to create a smart and friendly test workbench.en_US
dc.language.isoen_USen_US
dc.titleAutomation of synchronous bias transmission line pulsing systemen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2007 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PAPERSen_US
dc.citation.spage232en_US
dc.citation.epage+en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000247000000058en_US
dc.citation.woscount0en_US
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