Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique

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DC Field	Value	Language
dc.contributor.author	Chang, MF	en_US
dc.contributor.author	Chiou, LY	en_US
dc.contributor.author	Wen, KA	en_US
dc.date.accessioned	2014-12-08T15:18:44Z	-
dc.date.available	2014-12-08T15:18:44Z	-
dc.date.issued	2005-07-21	en_US
dc.identifier.issn	0013-5194	en_US
dc.identifier.uri	http://dx.doi.org/10.1049/el:20051738	en_US
dc.identifier.uri	http://hdl.handle.net/11536/13476	-
dc.description.abstract	A dynamic bitline shielding (DBS) technique is proposed for highspeed via-programming ROMs, to eliminate code-pattem-dependent crosstalk-induced read failure (CIRF) and increase code-pattem coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.	en_US
dc.language.iso	en_US	en_US
dc.title	Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1049/el:20051738	en_US
dc.identifier.journal	ELECTRONICS LETTERS	en_US
dc.citation.volume	41	en_US
dc.citation.issue	15	en_US
dc.citation.spage	834	en_US
dc.citation.epage	835	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000233419800003	-
dc.citation.woscount	0	-
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