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dc.contributor.authorHong, Chi-Haoen_US
dc.contributor.authorChiu, Yi-Weien_US
dc.contributor.authorZhao, Jun-Kaien_US
dc.contributor.authorJou, Shyh-Jyeen_US
dc.contributor.authorWang, Wen-Taien_US
dc.contributor.authorLee, Reeden_US
dc.date.accessioned2017-04-21T06:49:05Z-
dc.date.available2017-04-21T06:49:05Z-
dc.date.issued2015en_US
dc.identifier.isbn978-1-4799-8391-9en_US
dc.identifier.issn0271-4302en_US
dc.identifier.urihttp://hdl.handle.net/11536/134801-
dc.description.abstractIn this paper, we present source follower PMOS Read and bit-line under-drive techniques to improve the operation speed as compared to present commercial SRAM compilers. A source follower PMOS is utilized to connect local bit-lines (LBL) to global bit-lines (GBL) instead of using a NAND gate. To further improve the discharging time from LBL to GBL, we propose a bit-line under-drive circuit to reduce the voltage level of LBL. The simulated access time of the proposed macro is 445 ps at slow N slow P (SS) corner, -40 degrees C, 0.81 V. As compared to the SRAM macro which is generated by commercial SRAM compilers with the fastest combination, the access time of the proposed SRAM macro is 12% faster than that of commercial SRAM compilers. A 36kb high speed 6T SRAM macros with source follower PMOS Read and bit-line under-drive techniques is fabricated in 28nm HKMG CMOS process. The measurement results of the chip in SS corner show the proposed SRAM macro passes all MBIST patterns at 500 MHz at 0.81 V, room temperature.en_US
dc.language.isoen_USen_US
dc.subjectSRAMen_US
dc.subjecthigh speeden_US
dc.subjectsource follower PMOS Readen_US
dc.subjectbit-line under-driveen_US
dc.titleA 28nm 36kb High Speed 6T SRAM with Source Follower PMOS Read and Bit-Line Under-Driveen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)en_US
dc.citation.spage2549en_US
dc.citation.epage2552en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000371471002220en_US
dc.citation.woscount0en_US
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