RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method

Full metadata record

DC Field	Value	Language
dc.contributor.author	Chen, Kun-Ming	en_US
dc.contributor.author	Chen, Han-Yu	en_US
dc.contributor.author	Huang, Guo-Wei	en_US
dc.contributor.author	Liao, Wen-Shiang	en_US
dc.contributor.author	Chang, Chun-Yen	en_US
dc.date.accessioned	2017-04-21T06:48:55Z	-
dc.date.available	2017-04-21T06:48:55Z	-
dc.date.issued	2008	en_US
dc.identifier.isbn	978-1-4244-2641-6	en_US
dc.identifier.uri	http://hdl.handle.net/11536/135077	-
dc.language.iso	en_US	en_US
dc.title	RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	APMC: 2008 ASIA PACIFIC MICROWAVE CONFERENCE (APMC 2008), VOLS 1-5	en_US
dc.citation.spage	2110	en_US
dc.citation.epage	+	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000274900901025	en_US
dc.citation.woscount	0	en_US
Appears in Collections:	Conferences Paper