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dc.contributor.authorLin, JWen_US
dc.contributor.authorChen, CCen_US
dc.contributor.authorCheng, YTen_US
dc.date.accessioned2014-12-08T15:18:48Z-
dc.date.available2014-12-08T15:18:48Z-
dc.date.issued2005-07-01en_US
dc.identifier.issn0018-9383en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TED.2005.850612en_US
dc.identifier.urihttp://hdl.handle.net/11536/13514-
dc.description.abstractIn this paper, a robust micromachined spiral inductor with a cross-shaped sandwich membrane support is proposed and fabricated with fully CMOS compatible post-processes for radio frequency integrated circuit (RFIC) applications. Via the incorporation of a sandwich dielectric membrane (0.7 mu M SiO2/0.7 mu M Si3N4/0.7 mu m TEOS) to enhance the structure rigidity, the inductor can have better signal stability. In comparison, the new design of a similar to 5-nH micromachined inductor can have 45% less inductance variation than the one without the dielectric support while both devices are operated with 10 m/s(2) acceleration. Meanwhile, using a cross shape instead of blanket membrane can also effectively eliminate the inductance variation induced by the working temperature change (20 degrees C to 75 degrees C). The measurement results show the robust inductor can have similar electrical performance to the as-fabricated freely suspended inductor, which has five times Q (quality factor) improvement than the inductor without the substrate removal. It is our belief that the new micromachined inductors can have not only high-Q performance but also better signal stability suitable for wide-range RFIC applications.en_US
dc.language.isoen_USen_US
dc.subjectaccelerative and thermal disturbance systemen_US
dc.subjecthigh-Q micromachined inductoren_US
dc.subjectradio frequency integrated circuit (RFIC)en_US
dc.subjectrobust designen_US
dc.subjectsignal stabilityen_US
dc.titleA robust high-Q micromachined RF inductor for RFIC applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TED.2005.850612en_US
dc.identifier.journalIEEE TRANSACTIONS ON ELECTRON DEVICESen_US
dc.citation.volume52en_US
dc.citation.issue7en_US
dc.citation.spage1489en_US
dc.citation.epage1496en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000230123100028-
dc.citation.woscount37-
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