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dc.contributor.authorHsu, M. H.en_US
dc.contributor.authorLiu, H. L.en_US
dc.contributor.authorChang, W. J.en_US
dc.contributor.authorLin, J. Y.en_US
dc.date.accessioned2017-04-21T06:49:08Z-
dc.date.available2017-04-21T06:49:08Z-
dc.date.issued2007en_US
dc.identifier.issn1862-6351en_US
dc.identifier.urihttp://dx.doi.org/10.1002/pssc.200777159en_US
dc.identifier.urihttp://hdl.handle.net/11536/135164-
dc.description.abstractThe optical reflectance of single-crystalline Na0.68CoO2 (thickness around 3000 angstrom) thin film has been measured over a wide frequency (40-55000 cm(-1)) and at temperatures between 20 and 300 K. The room-temperature optical conductivity spectrum displays a metallic character. In addition, one E-1u phonon mode at about 518 cm(-1) is identified, while the other four phonon peaks are due to the sapphire substrate. As the temperature is lowered, the Drude plasma frequency exhibits little temperature dependence, whereas the scattering rate monotonically decreases with decreasing temperature. Notably, the Drude scattering rate at 20 K is found to approach zero, consistent with the small residual resistivity, indicating high quality of Na0.68CoO2 thin film. (C) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.en_US
dc.language.isoen_USen_US
dc.titleOptical properties of Na0.68CoO2 thin filmen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1002/pssc.200777159en_US
dc.identifier.journalPHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 4, NO 12en_US
dc.citation.volume4en_US
dc.citation.issue12en_US
dc.citation.spage4483en_US
dc.citation.epage+en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentInstitute of Physicsen_US
dc.identifier.wosnumberWOS:000254268500037en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper