標題: Improving ESD Robustness of Stacked Diodes with Embedded SCR for RF Applications in 65-nm CMOS
作者: Lin, Chun-Yu
Fan, Mei-Lian
Ker, Ming-Dou
Chu, Li-Wei
Tseng, Jen-Chou
Song, Ming-Hsiang
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: Diode;electrostatic discharge (ESD);radio-frequency (RF);silicon-controlled rectifier (SCR)
公開日期: 2014
摘要: To protect the radio-frequency (RF) integrated circuits from the electrostatic discharge (ESD) damage in nanoscale CMOS process, the ESD protection circuit must be carefully designed. In this work, stacked diodes with embedded silicon-controlled rectifier (SCR) to improve ESD robustness was proposed for RF applications. Experimental results in 65-nm CMOS process show that the proposed design can achieve low parasitic capacitance, low turn-on resistance, and high ESD robustness.
URI: http://hdl.handle.net/11536/135273
ISBN: 978-1-4799-3317-4
ISSN: 1541-7026
期刊: 2014 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM
Appears in Collections:Conferences Paper