標題: | Dark field image of full-field transmission hard x-ray microscope in 8-11 keV |
作者: | Yin, Gung-Chian Duewer, Fred Zeng, Xianghui Lyon, Alan Yun, Wenbing Chen, Fu-Rong Liang, K. S. 光電工程學系 Department of Photonics |
關鍵字: | transmission x-ray microscope;dark field;contrast |
公開日期: | 1-一月-2006 |
摘要: | We have demonstrated dark-field imaging using a full-field hard x-ray microscope by using a custom capillary-based condenser. The condenser provides illumination with a numeric aperture about 3-mrad with high efficiency. This high illumination angle allows full-resolution imaging using a 50 rim hard x-ray zone plate. The zeroth order beam from the condenser is well out of the zoneplate range - which allows a high signal-to-noise ratio in the image plane. Small particles with high scattering power, such as colloidal gold markers used in biology are well-suited for dark-field imaging. Combining with high brightness source from NSRRC BL01B, the dark field image can be acquired within several minutes with high contrast ratio. In this paper, the dark field image of IC and the zoneplate defect will be demonstrated and studied in different energy under dark field mode. |
URI: | http://dx.doi.org/10.1117/12.680216 http://hdl.handle.net/11536/135676 |
ISBN: | 0-8194-6396-5 |
ISSN: | 0277-786X |
DOI: | 10.1117/12.680216 |
期刊: | ADVANCES IN X-RAY/EUV OPTICS, COMPONENTS, AND APPLICATIONS |
Volume: | 6317 |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 會議論文 |