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dc.contributor.authorYin, Gung-Chianen_US
dc.contributor.authorDuewer, Freden_US
dc.contributor.authorZeng, Xianghuien_US
dc.contributor.authorLyon, Alanen_US
dc.contributor.authorYun, Wenbingen_US
dc.contributor.authorChen, Fu-Rongen_US
dc.contributor.authorLiang, K. S.en_US
dc.date.accessioned2019-04-03T06:47:11Z-
dc.date.available2019-04-03T06:47:11Z-
dc.date.issued2006-01-01en_US
dc.identifier.isbn0-8194-6396-5en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://dx.doi.org/10.1117/12.680216en_US
dc.identifier.urihttp://hdl.handle.net/11536/135676-
dc.description.abstractWe have demonstrated dark-field imaging using a full-field hard x-ray microscope by using a custom capillary-based condenser. The condenser provides illumination with a numeric aperture about 3-mrad with high efficiency. This high illumination angle allows full-resolution imaging using a 50 rim hard x-ray zone plate. The zeroth order beam from the condenser is well out of the zoneplate range - which allows a high signal-to-noise ratio in the image plane. Small particles with high scattering power, such as colloidal gold markers used in biology are well-suited for dark-field imaging. Combining with high brightness source from NSRRC BL01B, the dark field image can be acquired within several minutes with high contrast ratio. In this paper, the dark field image of IC and the zoneplate defect will be demonstrated and studied in different energy under dark field mode.en_US
dc.language.isoen_USen_US
dc.subjecttransmission x-ray microscopeen_US
dc.subjectdark fielden_US
dc.subjectcontrasten_US
dc.titleDark field image of full-field transmission hard x-ray microscope in 8-11 keVen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.680216en_US
dc.identifier.journalADVANCES IN X-RAY/EUV OPTICS, COMPONENTS, AND APPLICATIONSen_US
dc.citation.volume6317en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000241972700003en_US
dc.citation.woscount2en_US
Appears in Collections:Conferences Paper


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