完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChen, HYen_US
dc.contributor.authorChen, KMen_US
dc.contributor.authorHuang, GWen_US
dc.contributor.authorChang, CYen_US
dc.date.accessioned2014-12-08T15:18:53Z-
dc.date.available2014-12-08T15:18:53Z-
dc.date.issued2005-06-01en_US
dc.identifier.issn0916-8524en_US
dc.identifier.urihttp://dx.doi.org/10.1093/ietele/e88-c.6.1133en_US
dc.identifier.urihttp://hdl.handle.net/11536/13587-
dc.description.abstractDirect parameter extraction is believed to be the most accurate method for equivalent-circuits modeling of heterojunction bipolar transistors (HBT's). Using this method, the parasitic elements, followed by the intrinsic elements, are determined analytically. Therefore, the quality of the extrinsic elements extraction plays an important role in the accuracy and robustness of the entire extraction algorithm. This study proposes a novel extraction method for the extrinsic elements, which have been proven to be strongly correlated with the intrinsic elements. By utilizing the specific correlation. the equivalent circuit modeling is reduced to an optimistation problem of determining six specific extrinsic elements. Converting the intrinsic equivalent circuit into its common-col lector configuration, all intrinsic circuit elements are extracted using exact closed-form equations for both the hybrid-pi and the T-topology equivalent circuits. Additionally, a general explicit equation on the total extrinsic elements is derived, subsequently reducing the number of optimization variables. The modeling results are presented, showing that the proposed method can yield a good fit between the measured and calculated S parameters.en_US
dc.language.isoen_USen_US
dc.subjectHBT'sen_US
dc.subjectsmall signal modelingen_US
dc.subjectT-topologyen_US
dc.subjecthybrid-pi equivalent circuiten_US
dc.titleA novel approach for parameter determination of HBT small-signal equivalent circuiten_US
dc.typeArticleen_US
dc.identifier.doi10.1093/ietele/e88-c.6.1133en_US
dc.identifier.journalIEICE TRANSACTIONS ON ELECTRONICSen_US
dc.citation.volumeE88Cen_US
dc.citation.issue6en_US
dc.citation.spage1133en_US
dc.citation.epage1141en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000229824600006-
dc.citation.woscount5-
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