完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chiu, Yu-Chien | en_US |
dc.contributor.author | Cheng, Chun-Hu | en_US |
dc.contributor.author | Chang, Chun-Yen | en_US |
dc.contributor.author | Lee, Min-Hung | en_US |
dc.contributor.author | Hsu, Hsiao-Hsuan | en_US |
dc.contributor.author | Yen, Shiang-Shiou | en_US |
dc.date.accessioned | 2017-04-21T06:49:16Z | - |
dc.date.available | 2017-04-21T06:49:16Z | - |
dc.date.issued | 2015 | en_US |
dc.identifier.isbn | 978-4-86348-501-3 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/135996 | - |
dc.description.abstract | In this work, we report a one-transistor (1T) versatile memory; the memory transistor characteristics achieve sub-60-mV/dec operation and considerably low off-state leakage of 10(-15) A/mu m at a supply voltage below 0.5V. The versatile memory features DRAM/NVM functions of large Delta V-T window of 2.8V, fast 20-ns speed, 10(3)s retention at 85 degrees C, and long extrapolated 10(16) endurance at 85 degrees C, which show the potential for 3D memory application with severe requirement on both high density and low power consumption. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Low Power 1T DRAM/NVM Versatile Memory Featuring Steep Sub-60-mV/decade Operation, Fast 20-ns Speed, and Robust 85 degrees C-Extrapolated 10(16) Endurance | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2015 SYMPOSIUM ON VLSI TECHNOLOGY (VLSI TECHNOLOGY) | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000370559200040 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |