標題: 200nA Low Quiescent Current Deep-Standby Mode in 28nm DC-DC Buck Converter for Active Implantable Medical Devices
作者: Chu, Li-Cheng
Yang, Te-Fu
Huang, Ru-Yu
Su, Yi-Ping
Lin, Chiun-He
Wey, Chin-Long
Chen, Ke-Horng
Lin, Ying-Hsi
Lee, Chao-Cheng
Lin, Jian-Ru
Tsai, Tsung-Yen
交大名義發表
National Chiao Tung University
關鍵字: deep-standby mode (DSM);power management unit (PMU);active implantable medical devices (AIMD);embedded auto-cancellation (EAC)
公開日期: 2015
摘要: the proposed deep-standby mode (DSM) is used in 28nm power management unit (PMU) for long-term usage in active implantable medical devices (AIMD). The PMU can upgrade its normal mode with the proposed embedded auto-cancellation (EAC) technique in order to have high accuracy even if the battery is aging and the PVT variations occur. The test chip fabricated in 28nm CMOS process features low quiescent current of 200nA and output voltage accuracy of 98%. Seamless transition among the DSM and the accurate mode demonstrates both low quiescent current and high accuracy can be achieved in the proposed PMU.
URI: http://hdl.handle.net/11536/136013
ISBN: 978-1-4673-7191-9
期刊: 2015 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC)
起始頁: 205
結束頁: 208
Appears in Collections:Conferences Paper