標題: | Extremely High Mobility Ultra-Thin Metal-Oxide with ns(2)np(2) Configuration |
作者: | Shih, C. W. Chin, Albert Lu, Chun-Fu Yi, S. H. 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 2015 |
摘要: | To increase the transistor\'s current (I-ON) and decrease the off-state leakage (I-OFF), high-mobility, wide-bandgap and ultra-thin body channel materials are crucial for display, sub-10 nm MOSFET, and brain-mimicking 3D IC. The wide-bandgap ultra-thin-film SnO2 nMOSFET has achieved a high I-ON/I-OFF of > 10(7), and high mobility of >0.5X SiO2/Si device value operated at 1 MV/cm. The high mobility TFT is due to the overlapped orbitals. |
URI: | http://hdl.handle.net/11536/136042 |
ISBN: | 978-1-4673-9894-7 |
期刊: | 2015 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) |
顯示於類別: | 會議論文 |