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dc.contributor.authorWu, Tse-Chingen_US
dc.contributor.authorChen, Chien-Juen_US
dc.contributor.authorChen, Yin-Nienen_US
dc.contributor.authorHu, Vita Pi-Hoen_US
dc.contributor.authorSu, Pinen_US
dc.contributor.authorChuang, Ching-Teen_US
dc.date.accessioned2017-04-21T06:48:32Z-
dc.date.available2017-04-21T06:48:32Z-
dc.date.issued2015en_US
dc.identifier.isbn978-1-4799-7669-0en_US
dc.identifier.urihttp://hdl.handle.net/11536/136052-
dc.description.abstractIn this paper, we investigate the hybrid TFET-FinFET 32-bit carry-look-ahead adder (CLA) circuit and compare the delay, power and power-delay product (PDP) with all FinFET and all TFET implementations in near-threshold region. We use atomistic 3D TCAD mixed-mode simulations for transistor characteristics and HSPICE circuit simulations with look-up table based Verilog-A models calibrated with TCAD simulation results. In the hybrid design, TFETs are used for the top critical path to reduce the longest path delay, and FinFETs are used for the rest of the circuit to reduce switching power and leakage power. The PDP of the hybrid TFET-FinFET CLA circuit is better than the circuits with all FinFET and all TFET implementations in the vicinity of V-DD=0.3V. However, as the operating voltage is further reduced, the lower-ranked critical paths (e.g. 2nd critical path) with some FinFET devices in the path stick out, and the delay and PDP become inferior to all TFET implementation.en_US
dc.language.isoen_USen_US
dc.titleEvaluation of 32-Bit Carry-Look-Ahead Adder Circuit with Hybrid Tunneling FET and FinFET Devicesen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 International Conference on IC Design & Technology (ICICDT)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000380530800009en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper