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dc.contributor.authorKuo, Yi-Pingen_US
dc.contributor.authorHuang, Po-Tsangen_US
dc.contributor.authorWu, Chung-Shiangen_US
dc.contributor.authorLiang, Yu-Jieen_US
dc.contributor.authorChuang, Ching-Teen_US
dc.contributor.authorChu, Yuan-Huaen_US
dc.contributor.authorHwang, Weien_US
dc.date.accessioned2017-04-21T06:48:28Z-
dc.date.available2017-04-21T06:48:28Z-
dc.date.issued2015en_US
dc.identifier.isbn978-1-4799-6275-4en_US
dc.identifier.urihttp://hdl.handle.net/11536/136076-
dc.description.abstractIn this paper, an all-digitally controlled linear voltage regulator is proposed for ultra-low-power event-driven sensing platforms using a PMOS strength self-calibration technique. The voltage regulator generates the output voltage from 0.43V to 0.55V in steps of 30mV with a supply voltage of 0.6V. Against PVT and loading current variations, the PMOS strength self-calibration circuitry utilizes a voltage-detected coarse tune and a timing-detected fine tune for output ripple reduction. The coarse tune is designed to suppress the output voltage within the fine-tune region via a comparator-based error detector. Accordingly, the fine tune block detects the PMOS turn-on ratio in a specific time window for further reducing the output ripple. This linear voltage regulator is implemented using TSMC 65nm LP CMOS process. The simulation results show the best improvement of ripple reduction by 81%. Moreover, ns-order voltage transition time and the best ( lowest) FOM of 0.76 pA.s can be realized.en_US
dc.language.isoen_USen_US
dc.titleAll Digitally Controlled Linear Voltage Regulator with PMOS Strength Self-Calibration for Ripple Reductionen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 International symposium on VLSI Design, Automation and Test (VLSI-DAT)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000380584400021en_US
dc.citation.woscount0en_US
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