完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hung, Shao-Feng | en_US |
dc.contributor.author | Lin, Long-Yi | en_US |
dc.contributor.author | Hong, Hao-Chiao | en_US |
dc.date.accessioned | 2017-04-21T06:49:50Z | - |
dc.date.available | 2017-04-21T06:49:50Z | - |
dc.date.issued | 2014 | en_US |
dc.identifier.isbn | 978-1-4799-6030-9 | en_US |
dc.identifier.issn | 1081-7735 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/ATS.2014.23 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/136127 | - |
dc.description.abstract | The battery management system (BMS) is substantial in diagnosing and controlling the battery modules of emerging electric vehicles (EVs). This paper presents a cost-effective stimulus generator for characterizing the communication channels between the BMS host controller and the battery cells. The characterization data are useful to enhance the reliability of the communication. The proposed stimulus generator only consists of a digital oscillator, a reconfigurable digital Sigma-Delta modulator, and an output driver. The all-digital design saves the power and the hardware cost. The digital oscillator provides digital sine waves with well-controlled frequency and amplitude. The proposed reconfigurable digital Sigma-Delta modulator allows generating pulse-density-modulated (PDM) bit-streams of particular frequencies that cover the whole band of interest. Hence, the test accuracy is no less than that of conventional sinusoidal waves. Simulation results show that the generated stimuli have very high narrow-band SNRs that is essential to test the frequency responses of the channels. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Stimulus generator | en_US |
dc.subject | Reconfigurable Sigma-Delta modulator | en_US |
dc.subject | Channel characterization | en_US |
dc.subject | Power line communication | en_US |
dc.subject | Battery management system | en_US |
dc.title | A Cost-Effective Stimulus Generator for Battery Channel Characterization in Electric Vehicles | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1109/ATS.2014.23 | en_US |
dc.identifier.journal | 2014 IEEE 23RD ASIAN TEST SYMPOSIUM (ATS) | en_US |
dc.citation.spage | 63 | en_US |
dc.citation.epage | 67 | en_US |
dc.contributor.department | 電機學院 | zh_TW |
dc.contributor.department | College of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000380895400011 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |