標題: | Reliability, Adaptability and Flexibility in Timing: Buy a Life Insurance for Your Circuits |
作者: | Schlichtmann, Ulf Hashimoto, Masanori Jiang, Iris Hui-Ru Li, Bing 交大名義發表 National Chiao Tung University |
公開日期: | 2016 |
摘要: | At nanometer manufacturing technology nodes, process variations affect circuit performance significantly. In addition, performance deterioration of circuits due to aging effects is also increasing. Consequently, a large timing margin is required to maintain yield. To combat the pessimism and the resulting overdesign, aging analysis with high-level models, on-chip timing margin monitoring and tuning, and flexible delay models of flip-flops can be deployed. This paper gives an overview of the state of the art of applying these techniques to improve the health of circuits. |
URI: | http://hdl.handle.net/11536/136178 |
ISBN: | 978-1-4673-9569-4 |
ISSN: | 2153-6961 |
期刊: | 2016 21ST ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC) |
起始頁: | 705 |
結束頁: | 711 |
顯示於類別: | 會議論文 |