標題: Automatic Defense Through Fault Localization and Dynamic Patch Creation
作者: Chen, Hsia-Hsiang
Zheng, Da-Qun
Huang, Shih-Kun
資訊工程學系
資訊技術服務中心
Department of Computer Science
Information Technology Services Center
關鍵字: Cyber Grand Challenge (CGC);cyber reasoning system (CRS);fuzz testing;fault localization;binary patch
公開日期: 2016
摘要: The US Department of Defense has called for contest on automatic attack and defense. The contest is a competition, called Cyber Grand Challenge (CGC), aimed at developing cyber security systems. In accordance with the competition rules, we developed an automatic cyber reasoning system (CRS) that meets the objectives specified in the CGC. Our CRS combines the techniques of fuzz testing, fault localization, and binary patch creation to construct an automatic defense system. From the sample problems in the CGC, we evaluate our system and the binary patch capability by applying them to real programs. We explore two patching methods in five challenges in CGC with partial successes in availability and security.
URI: http://dx.doi.org/10.1109/QRS-C.2016.65
http://hdl.handle.net/11536/136259
ISBN: 978-1-5090-3713-1
DOI: 10.1109/QRS-C.2016.65
期刊: 2016 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE QUALITY, RELIABILITY AND SECURITY COMPANION (QRS-C 2016)
起始頁: 408
結束頁: 409
Appears in Collections:Conferences Paper