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dc.contributor.authorLuo, Zhicongen_US
dc.contributor.authorKer, Ming-Douen_US
dc.date.accessioned2017-04-21T06:48:21Z-
dc.date.available2017-04-21T06:48:21Z-
dc.date.issued2016en_US
dc.identifier.isbn978-1-4673-8900-6en_US
dc.identifier.issn2472-467Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/136454-
dc.description.abstractA new high-voltage-tolerant level shifter is proposed and verified in a 0.18-mu m CMOS process with 1.8-V/3.3-V devices, whereas the operation voltage can be up to 12V. The output signal of high-voltage-tolerant level shifter has an offset of 3 times the normal supply voltage (V-DD) of the used technology with respect to the input signal. The converting speed of level shifter is improved by using the coupling capacitors and the cross-coupled transistor pairs. Electrical overstress and the gate-oxide reliability issues can be fully eliminated because all transistors in the proposed level shifter are operating within the safe voltage range.en_US
dc.language.isoen_USen_US
dc.titleDesign of High-Voltage-Tolerant Level Shifter in Low Voltage CMOS Process for Neuro Stimulatoren_US
dc.typeProceedings Paperen_US
dc.identifier.journal2016 14TH IEEE INTERNATIONAL NEW CIRCUITS AND SYSTEMS CONFERENCE (NEWCAS)en_US
dc.contributor.department生醫電子轉譯研究中心zh_TW
dc.contributor.departmentBiomedical Electronics Translational Research Centeren_US
dc.identifier.wosnumberWOS:000386900400038en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper