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dc.contributor.authorMeng, Xiang-xien_US
dc.contributor.authorWang, Ya-shaen_US
dc.contributor.authorShi, Leien_US
dc.contributor.authorWang, Feng-jianen_US
dc.date.accessioned2017-04-21T06:48:26Z-
dc.date.available2017-04-21T06:48:26Z-
dc.date.issued2007en_US
dc.identifier.isbn978-0-7695-3057-4en_US
dc.identifier.urihttp://dx.doi.org/10.1109/ASPEC.2007.72en_US
dc.identifier.urihttp://hdl.handle.net/11536/136522-
dc.description.abstractAgile Methods have become a hot-spot in contemporary research and practice on software engineering. There are numerous successful and classic cases for applying agile methods. However software processes must adapt to the characteristics of projects, people and organizations. Since each software project is unique, we can hardly define a series of universal and repeatable processes for all agile projects. A pattern is a general solution to a common problem or issue, one from which a specific solution may be derived. This paper introduces concept of pattern into software process and organizes experience proved to be effective in agile methods as a group of patterns. Based on this group of process patterns, we propose a Process Pattern Language PPL for Agile Methods. Any agile project can find a series of process patterns from PPL according to its characteristics, and generate an appropriate process by following instructions from these patterns. We also give an example of applying this pattern language to generate software processes.en_US
dc.language.isoen_USen_US
dc.subjectagile methoden_US
dc.subjectsoftware processen_US
dc.subjectprocess patternen_US
dc.subjectpattern languageen_US
dc.titleA process pattern language for agile methodsen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/ASPEC.2007.72en_US
dc.identifier.journal14TH ASIA-PACIFIC SOFTWARE ENGINEERING CONFERENCE, PROCEEDINGSen_US
dc.citation.spage374en_US
dc.citation.epage+en_US
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:000252738800047en_US
dc.citation.woscount1en_US
Appears in Collections:Conferences Paper