Introduction to the special issue on the 2004 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

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DC 欄位	值	語言
dc.contributor.author	Pey, KL	en_US
dc.contributor.author	Trigg, A	en_US
dc.contributor.author	Chung, S	en_US
dc.date.accessioned	2014-12-08T15:19:03Z	-
dc.date.available	2014-12-08T15:19:03Z	-
dc.date.issued	2005-06-01	en_US
dc.identifier.issn	1530-4388	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/TDMR.2005.849903	en_US
dc.identifier.uri	http://hdl.handle.net/11536/13677	-
dc.language.iso	en_US	en_US
dc.title	Introduction to the special issue on the 2004 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)	en_US
dc.type	Editorial Material	en_US
dc.identifier.doi	10.1109/TDMR.2005.849903	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY	en_US
dc.citation.volume	5	en_US
dc.citation.issue	2	en_US
dc.citation.spage	167	en_US
dc.citation.epage	167	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.identifier.wosnumber	WOS:000230223000001	-
dc.citation.woscount	1	-
顯示於類別：	期刊論文

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