Introduction to the special issue on the 2004 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

標題:	Introduction to the special issue on the 2004 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
作者:	Pey, KL Trigg, A Chung, S 交大名義發表 National Chiao Tung University
公開日期:	1-Jun-2005
URI:	http://dx.doi.org/10.1109/TDMR.2005.849903 http://hdl.handle.net/11536/13677
ISSN:	1530-4388
DOI:	10.1109/TDMR.2005.849903
期刊:	IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume:	5
Issue:	2
起始頁:	167
結束頁:	167
Appears in Collections:	Articles

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