1. You are Here：

Full metadata record
DC FieldValueLanguage
dc.contributor.authorHuang, SYen_US
dc.contributor.authorLee, SFen_US
dc.contributor.authorHuang, JCen_US
dc.contributor.authorHwang, GHen_US
dc.contributor.authorYao, YDen_US
dc.date.accessioned2014-12-08T15:19:09Z-
dc.date.available2014-12-08T15:19:09Z-
dc.date.issued2005-05-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1850373en_US
dc.identifier.urihttp://hdl.handle.net/11536/13716-
dc.description.abstractWe report here the resistance of Co/NbxTi1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of Co/NbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed. (c) 2005 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titlePerpendicular interface resistance in Co/NbxTi1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6en_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1063/1.1850373en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume97en_US
dc.citation.issue10en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000230168300085-
Appears in Collections:Conferences Paper


Files in This Item:

  1. 000230168300085.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.

Related Contents
Loading...