完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Huang, SY | en_US |
dc.contributor.author | Lee, SF | en_US |
dc.contributor.author | Huang, JC | en_US |
dc.contributor.author | Hwang, GH | en_US |
dc.contributor.author | Yao, YD | en_US |
dc.date.accessioned | 2014-12-08T15:19:09Z | - |
dc.date.available | 2014-12-08T15:19:09Z | - |
dc.date.issued | 2005-05-15 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.1850373 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/13716 | - |
dc.description.abstract | We report here the resistance of Co/NbxTi1-x multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of Co/NbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed. (c) 2005 American Institute of Physics. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Perpendicular interface resistance in Co/NbxTi1-x multilayers for normal and superconducting NbTi alloy with x=0.4, 0.6 | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1063/1.1850373 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 97 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000230168300085 | - |
顯示於類別: | 會議論文 |