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dc.contributor.author吳慶源zh_TW
dc.contributor.authorChing-Yuan Wuen_US
dc.date.accessioned2017-10-06T06:17:28Z-
dc.date.available2017-10-06T06:17:28Z-
dc.date.issued1975-07en_US
dc.identifier.urihttp://hdl.handle.net/11536/137405-
dc.description.abstractThe mobility of elemental semiconductor is calculated for all fields up to breakdown by means of the path integral method. A self-consistent solution of the Boltzmann transport equation is obtained and analytic expressions for thr drift velocity,mobility and the relationship between electron temperature and the electric field is obtained. The validity of this calculation is limited to elemental semiconductors, such as Ge and Si at lattice temperatures high enough so that inter-valley scattering may be neglected, and the scattering is dominated by electron- phonon scattering. A comparison between theory and the experimental results for n-type and p-type Ge is made. It is found that agreement between theory and experiment is good for both n- and p-type Ge. A saturation velocity of 6.10*10^3 cm/sec between 2.1*10^3 v/cm and 5.1*10^3 v/cmis predicted for n-type Ge.zh_TW
dc.language.isoen_USen_US
dc.publisher交大學刊編輯委員會zh_TW
dc.titleCalculation of Electron Mobility in High Fields by Path Integral Methoden_US
dc.typeCampus Publicationsen_US
dc.identifier.journal交大學刊zh_TW
dc.identifier.journalSCIENCE BULLETIN NATIONAL CHIAO-TUNG UNIVERSITYen_US
dc.citation.volume8en_US
dc.citation.issue1en_US
dc.citation.spage71en_US
dc.citation.epage84en_US
顯示於類別:交大學刊


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