標題: | Improvement in instable analysis of heat inflation induced line-width after replacing pellicle with diamond film on reticle (photo-masks) |
作者: | Kuo, YK Chao, CG 材料科學與工程學系 Department of Materials Science and Engineering |
公開日期: | 1-Apr-2005 |
摘要: | A new reticle is designed that takes advantage of the high value of thermal conductivity of diamond to add a layer of diamond film to the bottom of traditional pellicle-reticle; that is, the new reticle replaces the pellicle with a diamond material. This method may help maintain the future manufacturing process of photo-lithography below 35 nm and can improve the problem of slightly out of shape reticle caused by the long-term effects of light and thermal energy. (c) 2004 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.mee.2004.11.013 http://hdl.handle.net/11536/13880 |
ISSN: | 0167-9317 |
DOI: | 10.1016/j.mee.2004.11.013 |
期刊: | MICROELECTRONIC ENGINEERING |
Volume: | 77 |
Issue: | 3-4 |
起始頁: | 297 |
結束頁: | 301 |
Appears in Collections: | Articles |
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