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dc.contributor.authorLin, CCen_US
dc.contributor.authorChen, HPen_US
dc.contributor.authorChen, SYen_US
dc.date.accessioned2014-12-08T15:19:32Z-
dc.date.available2014-12-08T15:19:32Z-
dc.date.issued2005-03-07en_US
dc.identifier.issn0009-2614en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.cplett.2005.01.047en_US
dc.identifier.urihttp://hdl.handle.net/11536/13915-
dc.description.abstractHighly arrayed nitrogen-doped ZnO nanorods were fabricated on Si buffered with ZnO film by combining wet-chemical process with post-treated by NH3 plasma. The X-ray photoelectron spectroscopy measurement demonstrates that the nitrogen-doped ZnO nanorods have been formed due to nitrogen diffusion through surface adsorption or defect routes. The photoluminescence spectra indicate that a strong UV emission peak around 3.31 eV with negligible deep level emission can be obtained for the nitrogen-doped ZnO nanorods compared to that of the untreated sample. The I-V measurements indicate that the p-type ZnO nanorods with a smaller threshold voltage of 1.5 V can be obtained. (C) 2005 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleSynthesis and optoelectronic properties of arrayed p-type ZnO nanorods grown on ZnO film/Si wafer in aqueous solutionsen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.cplett.2005.01.047en_US
dc.identifier.journalCHEMICAL PHYSICS LETTERSen_US
dc.citation.volume404en_US
dc.citation.issue1-3en_US
dc.citation.spage30en_US
dc.citation.epage34en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000227515500007-
dc.citation.woscount54-
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