Using a periodic square wave test-signal to detect crosstalk faults

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DC 欄位	值	語言
dc.contributor.author	Wu, MS	en_US
dc.contributor.author	Lee, CL	en_US
dc.date.accessioned	2014-12-08T15:19:38Z	-
dc.date.available	2014-12-08T15:19:38Z	-
dc.date.issued	2005-03-01	en_US
dc.identifier.issn	0740-7475	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/MDT.2005.49	en_US
dc.identifier.uri	http://hdl.handle.net/11536/13963	-
dc.description.abstract	This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns fault coverage for. most large benchmark circuits can exceed 90%.	en_US
dc.language.iso	en_US	en_US
dc.title	Using a periodic square wave test-signal to detect crosstalk faults	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1109/MDT.2005.49	en_US
dc.identifier.journal	IEEE DESIGN & TEST OF COMPUTERS	en_US
dc.citation.volume	22	en_US
dc.citation.issue	2	en_US
dc.citation.spage	160	en_US
dc.citation.epage	169	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:000228102300009	-
dc.citation.woscount	12	-
顯示於類別：	期刊論文

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