標題: | A unified approach to detecting crosstalk faults of interconnects in deep submicron VLSI |
作者: | Li, KSM Lee, CL Su, CC Chen, JE 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 2004 |
摘要: | The crosstalk fault effects in deep sub-micron VLSI, namely, glitches and the crosstalk-induced delay, are investigated. The origin of their occurrence, relationship and importance in circuit operation are elucidated. It is shown that the crosstalk-induced delay is only superposition of the induced glitch with the original signal delay on the affected victim line; and crosstalk-induced delay is more important in affecting the circuit performance, and should be considered in more details for testing. A scheme which is to detect both types of faults in a unified way by just detecting glitches is proposed and studied considering the manufacture process variation. In this way, detection of crosstalk-induced faults becomes much easier. |
URI: | http://hdl.handle.net/11536/18184 |
ISBN: | 0-7695-2235-1 |
ISSN: | 1081-7735 |
期刊: | 13TH ASIAN TEST SYMPOSIUM, PROCEEDINGS |
起始頁: | 145 |
結束頁: | 150 |
顯示於類別: | 會議論文 |