标题: 双波长锁模之单石量子点雷射
Dual-wavelength mode-locking of monolithic quantum-dot lasers
作者: 江君平
林国瑞
Chiang, Chun-Ping
Lin, Gray
电子研究所
关键字: 量子点;啁啾式堆叠量子点;被动式锁模雷射;Quantum Dot;Chirped;Dual-wavelength;mode-locking lasers
公开日期: 2016
摘要:   本论文研制被动锁模之单石半导体量子点雷射,并成功地实现单波长锁模与双波长锁模。我们挑选两片雷射磊晶片样品:样品一为均匀堆叠量子点主动层,样品二为啁啾式堆叠量子点主动层。制程上则是将传统脊状波导分隔为双区段电极,我们分别采用湿式蚀刻与干式蚀刻进行两次制程,由于干式蚀刻的良率不佳,因此委托光电公司进行第三次的制程。我们将此三批元件进行一系列的量测,包括L-I-V光电特性、光谱、RF频谱与脉冲宽度等;此外,为深入了解操作条件对锁模雷射特性的影响,我们架设自动量测系统对元件顺向电流与逆向偏压进行阵列扫瞄并作成二维映射图(2D mapping image)。双波长锁模现象除了可透过RF频谱的拍频讯号而间接获得证实,我们也在侦测前加上高品质的长通滤光片或短通滤光片,直接验证双波长锁模并厘清个别波长的效应。

  本研究的双波长锁模量子点雷射有别于现有的文献发表,其差异在于量子点堆叠的波长与数量是经过刻意的设计,因此从光谱就能确定双雷射波长分别来自不同堆叠的基态能阶,而非文献上来自相同堆叠的基态与激态能阶,同时我们的双波长锁模元件也具有较低操作电流与较高光功率输出等优点。实验上所量测到的双雷射波长约在1270 nm与1233 nm附近,因此高通/低通滤光片可以轻易地选购在1250 nm波段,即可清楚分出两雷射波长的光功率强度;此外,光脉冲量测的二次对谐波产生对于波长也有很好的解析能力,目前在相同操作条件下所量测的最佳脉冲宽度,长波长约10 ps,而短波长约7 ps。由于锁模量子点雷射的双锁模现象相当新颖而复杂,我们也针对不同吸收与增益比例进行一系列量测,论文中也将讨论初步的量测结果。
In this thesis, we have fabricated monolithic passively mod-locked semiconductor quantum-dot (QD) lasers, and successfully achieved both single-wavelength mode-locking and dual-wavelength mode-locking. We selected two epitaxial laser samples; one is with uniformly stacked QD active layers, another is with chirped multilayer QD active region. The device process is based on two-section ridge-waveguide with two separate contacts. We have carried out both wet-etching and dry-etching process; however, the device yield involving dry-etching process is rather low. The third process is therefore outsourced to local optoelectronics company in Taiwan. Three batches of mode-locked lasers are then taken under a series of measurements, including L-I-V characteristics, optical spectrum, RF spectrum, and optical pulse widths. Automated measurement system is also setup to perform two-dimensional mapping of device characteristics on operation conditions of both forward current and reverse bias. The indirect evidence of dual-wavelength mode-locking can be drawn from the beating of two dominant peak frequencies in RF spectrum. To make direct confirmation and resolve contributions of two individual wavelengths, we put high quality long-pass or short-pass optical filters before all the detection and measurement.

The dual-wavelength mode-locked QD lasers in this study are different from those in previous publications, where two lasing wavelengths are originated from ground-state and excited-state emissions. In our chirped multilayer QD sample, the chirped wavelengths and QD stacking numbers are intentionally designed and grown. Therefore two mode-locked wavelengths are easily identified as two ground-state emissions from different QD stacks. Moreover, our dual-wavelength mode-locked devices have advantages of lower operation current and higher optical output. In our experiment, the two lasing wavelengths are around 1270 nm and 1233 nm, which are easily resolved by long-pass or short-pass optical filters with cut-on or cut-off wavelength at 1250 nm. By the way, the second-harmonic generation in optical pulse measurement is also wavelength dependent. Under the certain bias condition, the optimum pulse width is about 10 ps for long wavelength emission, and about 7 ps for short wavelength emission. Since properties of dual-wavelength mode-locked devices are rather novel and complicated, measurements on different absorber-to-gain length ratios are performed and discussed in the thesis.
URI: http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070350166
http://hdl.handle.net/11536/139931
显示于类别:Thesis