以SIFT及模板匹配為基礎實現DIP式 Y電容外形自動檢測之研究

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	劉宜容	zh_TW
dc.contributor.author	林昇甫	zh_TW
dc.contributor.author	Liu, Yi-Rong	en_US
dc.contributor.author	Lin, Sheng-Fuu	en_US
dc.date.accessioned	2018-01-24T07:40:01Z	-
dc.date.available	2018-01-24T07:40:01Z	-
dc.date.issued	2016	en_US
dc.identifier.uri	http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070260614	en_US
dc.identifier.uri	http://hdl.handle.net/11536/140995	-
dc.language.iso	zh_TW	en_US
dc.subject	自動光學檢測	zh_TW
dc.subject	插件式(DIP)電容	zh_TW
dc.subject	瑕疵檢測	zh_TW
dc.subject	Automated Optical Inspection	en_US
dc.subject	(DIP) capacitor	en_US
dc.subject	Defect Detection	en_US
dc.title	以SIFT及模板匹配為基礎實現DIP式 Y電容外形自動檢測之研究	zh_TW
dc.title	A SIFT and Template Matching Based Automatic Appearance Detection Method for DIP Y-Type Capacitors	en_US
dc.type	Thesis	en_US
dc.contributor.department	電機學院電機與控制學程	zh_TW
顯示於類別：	畢業論文