14奈米鰭式電晶體自熱效應的新穎溫度量測方法 及其對傳輸機制之影響

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	江孟儒	zh_TW
dc.contributor.author	莊紹勳	zh_TW
dc.contributor.author	Jiang, Meng-Ru	en_US
dc.contributor.author	Chung, Steve S.	en_US
dc.date.accessioned	2018-01-24T07:42:00Z	-
dc.date.available	2018-01-24T07:42:00Z	-
dc.date.issued	2017	en_US
dc.identifier.uri	http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070450122	en_US
dc.identifier.uri	http://hdl.handle.net/11536/142285	-
dc.language.iso	en_US	en_US
dc.subject	自熱效應	zh_TW
dc.subject	可靠度	zh_TW
dc.subject	傳輸理論	zh_TW
dc.subject	電晶體溫度	zh_TW
dc.subject	self-heating effect	en_US
dc.subject	transport	en_US
dc.subject	temperature	en_US
dc.title	14奈米鰭式電晶體自熱效應的新穎溫度量測方法及其對傳輸機制之影響	zh_TW
dc.title	A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism	en_US
dc.type	Thesis	en_US
dc.contributor.department	電子研究所	zh_TW
顯示於類別：	畢業論文