標題: 無排列缺陷之鐵電式液晶全相位調製元件 及其驅動方式
Alignment Defect Free, Full Phase Modulation Ferroelectric Liquid Crystal Device and It’s Driving waveform
作者: 溫健智
陳皇銘
Wen, Jian-Zhi
Chen, Huang-Ming
光電工程研究所
關鍵字: 鐵電型液晶;全相位調製;FLC;Alignment Defect Free;Full Phase Modulation
公開日期: 2017
摘要: 表面穩定鐵電式液晶(surface-stabilized FLC)元件是目前廣為研究的鐵電式液晶元件技術,除了反應時間快,因為平面的分子運動,其視角也較傳統液晶顯示器大,然而表面穩定鐵電型液晶元件的應用在過去的研究中有兩個主要的問題,缺乏連續的灰階以及難有良好的液晶排列,此缺點嚴重影響到液晶元件的對比度。除了雙穩態之表面穩定鐵電型液晶模式,半V型鐵電式液晶(half-V switching mode FLC)模式是以改變光軸方向而達到連續灰階,可是若要得到固定的灰階值,就必須輸入直流電壓,這會使液晶的壽命加速減少,所以我們以交流電壓的驅動方式,藉由改變輸入的頻率以及工作週期(duty cycle)來達到不同的灰階值。然而半V型鐵電式液晶元件於液晶排列上仍有缺陷存在,在降溫的過程中,液晶分子雖然順著配向處理的方向排列,卻因層列層排列方向之不同,使得液晶分子有兩個極性方向之排列,因而產生兩種排列區塊,名為水平山形袖章缺陷(horizontal chevron defect),而我們藉著控制配向層之表面極性,上下基板分別使用極性相反的配向層材料。使用非對稱配向技術,在液晶盒厚度小於1.6 μm 且配向層表面平坦的液晶盒中成功地去除了水平山形袖章缺陷,最後將我們的液晶應用於LCoS上。
Many studies have confirmed that the fast response of surface-stabilized ferroelectric liquid crystal (SSFLC) is suitable for fast switching devices. However, the lack of a continuous gray scale limits the potential for display application. In order to get the continuously gray scale, we changed the input waveform to measure the R3206-50 cell E-O properties at 532 nm under 10 V and 10 Khz square wave. When we changed the square wave duty cycle from 50% to 90%, the HV-FLC cell E-O properties had also changed the transmittance corresponds to duty cycle continuously. The major drawback in HV-FLC devices is the horizontal chevron alignment defect. In the PVA-PI asymmetrical surface polarity hybrid cell, the layer structure of HV -FLC appeared in uniform direction and the horizontal chevron defects were completely suppressed After utilizing asymmetrical hybrid cell, contrast ratios and horizontal chevron defects of R3206–50 were greatly improved
URI: http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070450556
http://hdl.handle.net/11536/142545
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