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dc.contributor.authorHwang, Ruey-Chingen_US
dc.contributor.authorCheng, K. F.en_US
dc.contributor.authorLee, Jack C.en_US
dc.date.accessioned2014-12-08T15:20:11Z-
dc.date.available2014-12-08T15:20:11Z-
dc.date.issued2007-08-01en_US
dc.identifier.issn0277-6693en_US
dc.identifier.urihttp://dx.doi.org/10.1002/for.1027en_US
dc.identifier.urihttp://hdl.handle.net/11536/14320-
dc.description.abstractBankruptcy prediction methods based on a semiparametric logit model are proposed for simple random (prospective) and case-control (choice-based; retrospective) data. The unknown parameters and prediction probabilities in the model are estimated by the local likelihood approach, and the resulting estimators are analyzed through their asymptotic biases and variances. The semiparametric bankruptcy prediction methods using these two types of data are shown to be essentially equivalent. Thus our proposed prediction model can be directly applied to data sampled from the two important designs. One real data example and simulations confirm that our prediction method is more powerful than alternatives, in the sense of yielding smaller out-of-sample error rates. Copyright (C) 2007 John Wiley & Sons, Ltd.en_US
dc.language.isoen_USen_US
dc.subjectlinear logit modelen_US
dc.subjectout-of-sample error rateen_US
dc.subjectsemiparametric logit modelen_US
dc.titleA semiparametric method for predicting bankruptcyen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/for.1027en_US
dc.identifier.journalJOURNAL OF FORECASTINGen_US
dc.citation.volume26en_US
dc.citation.issue5en_US
dc.citation.spage317en_US
dc.citation.epage342en_US
dc.contributor.department管理科學系zh_TW
dc.contributor.department資訊管理與財務金融系 註:原資管所+財金所zh_TW
dc.contributor.departmentDepartment of Management Scienceen_US
dc.contributor.departmentDepartment of Information Management and Financeen_US
dc.identifier.wosnumberWOS:000249291600002-
dc.citation.woscount12-
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