標題: | Comparative investigation of Schottky barrier height of Ni/n-type Ge and Ni/n-type GeSn |
作者: | Jheng, Li Sian Li, Hui Chang, Chiao Cheng, Hung Hsiang Li, Liang Chen 奈米科技中心 Center for Nanoscience and Technology |
公開日期: | 1-九月-2017 |
摘要: | We report an investigation of the Schottky barrier height (SBH) of Ni/n-type Ge and Ni/n-type GeSn films that is annealed at a wide range of temperatures. Both voltage-and temperature-dependent current-voltage (I-V) measurements are performed. From the analysis of these nonlinear I-V traces, the SBH is found and the results shows that the SBH of Ni/n-type GeSn (a) is smaller than that of Ni/n-type Ge and (b) decreases with the Sn content of the surface GeSn layer associated with the thermal annealing. By modeling the composition-and strain-dependent energy bandgap (E-g), the relationship between the SBH and Eg is established and it is found that SBH/E-g similar to 0.8. These results suggest that the GeSn film could serve as an interfacial layer for the reduction of the SBH in Ge-based electronic devices that are desirable for applications. (C) 2017 Author(s). |
URI: | http://dx.doi.org/10.1063/1.4997348 http://hdl.handle.net/11536/143858 |
ISSN: | 2158-3226 |
DOI: | 10.1063/1.4997348 |
期刊: | AIP ADVANCES |
Volume: | 7 |
Issue: | 9 |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 期刊論文 |