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dc.contributor.authorHsu, Wei-Tingen_US
dc.contributor.authorLu, Li-Syuanen_US
dc.contributor.authorWang, Deanen_US
dc.contributor.authorHuang, Jing-Kaien_US
dc.contributor.authorLi, Ming-Yangen_US
dc.contributor.authorChang, Tay-Rongen_US
dc.contributor.authorChou, Yi-Chiaen_US
dc.contributor.authorJuang, Zhen-Yuen_US
dc.contributor.authorJeng, Horng-Tayen_US
dc.contributor.authorLi, Lain-Jongen_US
dc.contributor.authorChang, Wen-Haoen_US
dc.date.accessioned2019-04-03T06:42:03Z-
dc.date.available2019-04-03T06:42:03Z-
dc.date.issued2017-10-13en_US
dc.identifier.issn2041-1723en_US
dc.identifier.urihttp://dx.doi.org/10.1038/s41467-017-01012-6en_US
dc.identifier.urihttp://hdl.handle.net/11536/143919-
dc.description.abstractMonolayer transition metal dichalcogenides, such as MoS2 and WSe2, have been known as direct gap semiconductors and emerged as new optically active materials for novel device applications. Here we reexamine their direct gap properties by investigating the strain effects on the photoluminescence of monolayer MoS2 and WSe2. Instead of applying stress, we investigate the strain effects by imaging the direct exciton populations in monolayer WSe2-MoS2 and MoSe2-WSe2 lateral heterojunctions with inherent strain inhomogeneity. We find that unstrained monolayer WSe2 is actually an indirect gap material, as manifested in the observed photoluminescence intensity-energy correlation, from which the difference between the direct and indirect optical gaps can be extracted by analyzing the exciton thermal populations. Our findings combined with the estimated exciton binding energy further indicate that monolayer WSe2 exhibits an indirect quasiparticle gap, which has to be reconsidered in further studies for its fundamental properties and device applications.en_US
dc.language.isoen_USen_US
dc.titleEvidence of indirect gap in monolayer WSe2en_US
dc.typeArticleen_US
dc.identifier.doi10.1038/s41467-017-01012-6en_US
dc.identifier.journalNATURE COMMUNICATIONSen_US
dc.citation.volume8en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000412871700013en_US
dc.citation.woscount19en_US
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