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dc.contributor.authorWen, Hua-Chiangen_US
dc.contributor.authorChou, Wu-Chingen_US
dc.contributor.authorLin, Po-Chenen_US
dc.contributor.authorJeng, Yeau-Renen_US
dc.contributor.authorChen, Chien-Changen_US
dc.contributor.authorChen, Hung-Mingen_US
dc.contributor.authorJiang, Don Sonen_US
dc.contributor.authorCheng, Chun-Huen_US
dc.date.accessioned2018-08-21T05:52:53Z-
dc.date.available2018-08-21T05:52:53Z-
dc.date.issued2017-11-01en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.microrel.2017.05.004en_US
dc.identifier.urihttp://hdl.handle.net/11536/144058-
dc.description.abstractUsing nanoindentation and energy dispersive X-ray spectrometry (EDS), we have conducted an investigation into corner failures to elucidate not only the nanomechanical properties of Sn-37Pb solder balls but also the effects of temperature cycling tests (TCTs). We found that the hardness of Sn-37Pb solder balls was greater in central locations [1.18 +/- 0.05 GPa for room-temperature (RT) sample; 1.3 +/- 0.05 GPa for TCT sample], but had standard values in corner locations (>0.2 +/- 0.02 GPa). The modulus increased after the TCTs. Nevertheless, the mechanical properties were closely related to the average area of the alpha-Pb phase. The average area of the Pb-rich region was more stable after the TCTs than that of the RT sample, due to the enhanced mechanical properties of the Sn-37Pb solder, suggesting good reliability. From an analysis of average areas in the RT sample, it appears that the Pb-rich solid solution that formed led to weak Sn-Pb bonds near the corner locations. Electron back scattered diffraction measurements revealed that grains with grain boundaries formed as a result of accelerated TCT cycling. We conclude that Sn-Pb recrystallization was initiated and propagated after the TCTs, followed by propagation to the interfacial region. (C) 2017 Published by Elsevier Ltd.en_US
dc.language.isoen_USen_US
dc.subjectIntermetallic compoundsen_US
dc.subjectDiffusionen_US
dc.subjectRecrystallizationen_US
dc.subjectElectron microscopyen_US
dc.titleUsing nanoindentation to investigate the temperature cycling of Sn-37Pb soldersen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.microrel.2017.05.004en_US
dc.identifier.journalMICROELECTRONICS RELIABILITYen_US
dc.citation.volume78en_US
dc.citation.spage111en_US
dc.citation.epage117en_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000414880200014en_US
Appears in Collections:Articles