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dc.contributor.authorTsai, Yi-Chiaen_US
dc.contributor.authorLi, Yimingen_US
dc.date.accessioned2018-08-21T05:53:13Z-
dc.date.available2018-08-21T05:53:13Z-
dc.date.issued2018-02-01en_US
dc.identifier.issn0018-9383en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TED.2017.2782667en_US
dc.identifier.urihttp://hdl.handle.net/11536/144406-
dc.description.abstractDoping engineering has been an emerging topic in monolayer molybdenum disulfide (mMoS(2)). However, the dopants used for an n-or p-type device and the effect of doping level are of great interests toward nextgeneration electronic devices. In this paper, we theoretically reveal the work function tunability of mMoS(2) doped by 3d transition metals. We found that the titanium dopant forms a deep-level trap in the midgap of mMoS(2) but turning into n-type donor levels in high doping concentration due to the stronger covalent bond and the stable surface morphology, which renders it the widest work function tunability among 3d transitionmetals. Overall, the n-typebehavior is expected by doping with chromium, copper, scandium, and titanium, whereas nickel and zinc dopants lead to the p-type property. The findings feature the selection of dopants for the revolutionary device and highlight the impact of doping levels from the atomistic viewpoint.en_US
dc.language.isoen_USen_US
dc.subject2-D materialsen_US
dc.subjectdopingen_US
dc.subjectelectronics structureen_US
dc.subjectfirst-principles calculationen_US
dc.subjectmolybdenum disulfideen_US
dc.titleImpact of Doping Concentration on Electronic Properties of Transition Metal-Doped Monolayer Molybdenum Disulfideen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TED.2017.2782667en_US
dc.identifier.journalIEEE TRANSACTIONS ON ELECTRON DEVICESen_US
dc.citation.volume65en_US
dc.citation.spage733en_US
dc.citation.epage738en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000423124500053en_US
Appears in Collections:Articles