標題: Structural, magnetic, and ferroelectric properties of T-like cobalt-doped BiFeO3 thin films
作者: Young, T.
Sharma, P.
Kim, D. H.
Ha, Thai Duy
Juang, Jenh-Yih
Chu, Y. -H.
Seidel, J.
Nagarajan, V.
Yasui, S.
Itoh, M.
Sando, D.
材料科學與工程學系
電子物理學系
Department of Materials Science and Engineering
Department of Electrophysics
公開日期: 1-二月-2018
摘要: We present a comprehensive study of the physical properties of epitaxial cobalt-doped BiFeO3 films similar to 50 nm thick grown on (001) LaAlO3 substrates. X-ray diffraction and magnetic characterization demonstrate high quality purely tetragonal-like (T') phase films with no parasitic impurities. Remarkably, the step-and-terrace film surface morphology can be fully recovered following a local electric-field-induced rhombohedrallike to T' phase transformation. Local switching spectroscopy experiments confirm the ferroelectric switching to follow previously reported transition pathways. Critically, we show unequivocal evidence for conduction at domain walls between polarization variants in T'-like BFO, making this material system an attractive candidate for domain wall-based nanoelectronics. (c) 2018 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license.
URI: http://dx.doi.org/10.1063/1.5011783
http://hdl.handle.net/11536/144648
ISSN: 2166-532X
DOI: 10.1063/1.5011783
期刊: APL MATERIALS
Volume: 6
顯示於類別:期刊論文