完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Sun, Kien Wen | en_US |
dc.contributor.author | Ko, Ting-Yu | en_US |
dc.contributor.author | Shellaiah, Muthaiah | en_US |
dc.date.accessioned | 2018-08-21T05:53:28Z | - |
dc.date.available | 2018-08-21T05:53:28Z | - |
dc.date.issued | 2018-04-01 | en_US |
dc.identifier.issn | 0947-8396 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1007/s00339-018-1741-z | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/144741 | - |
dc.description.abstract | In this paper, we report the results of our experiments on and measurements of electrical resistivity and thermoelectric power (Seebeck coefficient) from single-crystalline antimony triselenide (Sb2Se3) single nanowires (NWs) with high resistivity (sigma similar to 4.37 x 10(-4) S/m). A positive Seebeck coefficient of approximately 661 mu V/K at room temperature was obtained using a custom-made thermoelectric power probe with an alternating current lock-in method (the 2 omega technique), which indicates that the thermal transport is dominated by holes. The measured Seebeck coefficient of the NWs is a factor of 2-3 lower than their bulk counterparts and is comparable to that of a highly conductive Sb2Se3 single NWs (approximately -750 mu V/K). We observed an increase in the Seebeck coefficients with increased bias voltages by field-effect gating, which cannot be explained by the modulation of the Fermi level in the NWs. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Field-effect-dependent thermoelectric power in highly resistive Sb2Se3 single nanowire | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1007/s00339-018-1741-z | en_US |
dc.identifier.journal | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | en_US |
dc.citation.volume | 124 | en_US |
dc.contributor.department | 應用化學系 | zh_TW |
dc.contributor.department | 電機學院 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Applied Chemistry | en_US |
dc.contributor.department | College of Electrical and Computer Engineering | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000428454200036 | en_US |
顯示於類別: | 期刊論文 |