標題: | Comparison of Parasitic Capacitances of Packaged Cascode Gallium Nitride Field-efect Transistors |
作者: | Wu, Chih-Chiang Jeng, Shyr-Long 機械工程學系 Department of Mechanical Engineering |
關鍵字: | gallium nitride;cascode;parasitic capacitance |
公開日期: | 1-Jan-2018 |
摘要: | In this work, we examined the electrical characteristics of laboratory-fabricated cascode gallium nitride field-effect transistors (GaN FETs) and analyzed their parasitic capacitances. The calculated results were in good agreement with the experimental results and showed that commercial GaN FETs have superior switching performance, whereas laboratory-fabricated GaN FETs require further improvement. |
URI: | http://dx.doi.org/10.18494/SAM.2018.1746 http://hdl.handle.net/11536/144934 |
ISSN: | 0914-4935 |
DOI: | 10.18494/SAM.2018.1746 |
期刊: | SENSORS AND MATERIALS |
Volume: | 30 |
Issue: | 1 |
起始頁: | 453 |
結束頁: | 461 |
Appears in Collections: | Articles |