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dc.contributor.authorLin, Taoen_US
dc.contributor.authorKuo, Hao Chungen_US
dc.contributor.authorJiang, Xiao Dongen_US
dc.contributor.authorFeng, Zhe Chuanen_US
dc.date.accessioned2019-04-03T06:35:49Z-
dc.date.available2019-04-03T06:35:49Z-
dc.date.issued2017-02-21en_US
dc.identifier.issn1556-276Xen_US
dc.identifier.urihttp://dx.doi.org/10.1186/s11671-017-1922-2en_US
dc.identifier.urihttp://hdl.handle.net/11536/145209-
dc.description.abstractThis paper reports the transient photoluminescence (PL) properties of an InGaN/GaN multiple quantum well (MQW) light-emitting diode (LED) with green emission. Recombination of localized excitons was proved to be the main microscopic mechanism of green emission in the sample. The PL dynamics were ascribed to two pathways of the exciton recombination, corresponding to the fast decay and the slow decay, respectively. The origins of slow decay and fast decay were assigned to local compositional fluctuations of indium and thickness variations of InGaN layers, respectively. Furthermore, the contributions of two decay pathways to the green PL were found to vary at different emission photon energy. The fraction of fast decay pathway decreased with decreasing photon energy. The slow radiative PL from deep localized exciton recombination suffered less suppression from non-radiative delocalization process, for the higher requested activation energy. All these results supported a clear microscopy mechanism of excitation-emission process of the green MQW LED structure.en_US
dc.language.isoen_USen_US
dc.subjectLight-emitting diodesen_US
dc.subjectPhotoluminescenceen_US
dc.subjectExciton localizationen_US
dc.titleRecombination Pathways in Green InGaN/GaN Multiple Quantum Wellsen_US
dc.typeArticleen_US
dc.identifier.doi10.1186/s11671-017-1922-2en_US
dc.identifier.journalNANOSCALE RESEARCH LETTERSen_US
dc.citation.volume12en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.identifier.wosnumberWOS:000397584600007en_US
dc.citation.woscount9en_US
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