標題: Simulation and Experimental Study on Barrier Thickness of Superlattice Electron Blocking Layer in Near-Ultraviolet Light-Emitting Diodes
作者: Kuo, Yen-Kuang
Chen, Fang-Ming
Lin, Bing-Cheng
Chang, Jih-Yuan
Shih, Ya-Hsuan
Kuo, Hao-Chung
光電工程學系
Department of Photonics
關鍵字: Light-emitting diodes;superlattices;quantum well devices
公開日期: 1-八月-2016
摘要: The optical performance and relevant physical properties of near-ultraviolet (NUV) GaN-based light-emitting diodes (LEDs) are investigated. Specifically, the influence of traditional AlGaN bulk electron blocking layer (EBL) and AlGaN/GaN superlattice (SL) EBL with various thicknesses of AlGaN layers on NUV LEDs is explored. It is indicated from the band diagrams, electrostatic field profile, electron reflecting and hole transmitting spectra, and carrier concentrations profile that the use of a thin AlGaN layer of AlGaN/GaN SL EBL is beneficial to the electron confinement and hole injection in the active region, which results in the high internal quantum efficiency and low efficiency droop at high injection current. Moreover, the experimental results show that replacing the traditional AlGaN bulk EBL with the AlGaN/GaN SL EBL can markedly improve the optical performance. When compared with the NUV LED with traditional AlGaN bulk EBL, the output power of the NUV LED with the proposed AlGaN/GaN SL EBL increases from 13.5 to 48.7 mW at 100 mA.
URI: http://dx.doi.org/10.1109/JQE.2016.2587100
http://hdl.handle.net/11536/145557
ISSN: 0018-9197
DOI: 10.1109/JQE.2016.2587100
期刊: IEEE JOURNAL OF QUANTUM ELECTRONICS
Volume: 52
顯示於類別:期刊論文