完整後設資料紀錄
DC 欄位語言
dc.contributor.authorWang, Cheng-Jyunen_US
dc.contributor.authorYou, Hsin-Chiangen_US
dc.contributor.authorKo, Fu-Hsiangen_US
dc.date.accessioned2018-08-21T05:54:13Z-
dc.date.available2018-08-21T05:54:13Z-
dc.date.issued2017-06-05en_US
dc.identifier.issn0167-9317en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.mee.2017.02.024en_US
dc.identifier.urihttp://hdl.handle.net/11536/145679-
dc.description.abstractThis study examined the use of a simple sol-gel method for synthesizing indium zinc oxide (IZO) films for use as semiconductor channel layers in thin-film transistors (TFTs) fabricated on flexible polyimide substrates. The performance of the flexible IZO-based TFTs was investigated, and the entire process was conducted at a low temperature to ensure the flexibility of the devices. First, transistors were fabricated on a flexible substrate by using silicon nitride and silicon dioxide as dielectric layers to investigate the effect on the on/off current ratios and electronic mobility of the devices. Second, the dielectric layer thickness was increased to enhance device performance, and the devices were finally subjected to bending tests to confirm their flexibility and stability for flexible transistor applications. The study successfully increased the dielectric layer thickness to improve flexible IZO-based TFT performance. (C) 2017 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectSol-gel methoden_US
dc.subjectIndium zinc oxide (IZO)en_US
dc.subjectThin-film transistor (TFT)en_US
dc.subjectFlexible substrateen_US
dc.subjectDielectric layeren_US
dc.titleThe highly electrical performances of flexible indium-zinc-oxide based thin-film transistors on stability improvement by passivation layeren_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.mee.2017.02.024en_US
dc.identifier.journalMICROELECTRONIC ENGINEERINGen_US
dc.citation.volume177en_US
dc.citation.spage87en_US
dc.citation.epage92en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000403997500018en_US
顯示於類別:期刊論文